| 摘要 |
With the invention, when an external force is applied to the tip of an objective lens in a direction intersecting the optical axis thereof, that external force is effectively relieved, thus maintaining the integrity of the objective lens and specimen. The invention provides a microscope examination apparatus including an apparatus main body, a base member secured to the apparatus main body, an objective-lens mounting member for mounting an objective lens unit, and a support mechanism for supporting the objective-lens mounting member in such a manner as to enable movement thereof in a direction intersecting the optical axis of the objective lens unit relative to the base member.
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