发明名称 Polishing pad and method of fabricating semiconductor substrate using the pad
摘要 It is provided a polishing pad of novel construction capable of controlling actively and efficiently a slurry flow during polishing a surface of a semiconductor substrate, such as a wafer, thus making it possible to precisely and stably performing a desired polishing process. Onto a surface of a pad substrate 12 of synthetic resin material, formed is a groove 16 extending approximately circumferentially. An inner circumferential wall surface 20 and an outer circumferential wall surface 22 are made parallel to each other and slant with respect to a center axis 18 of the pad substrate 12.
申请公布号 US7121938(B2) 申请公布日期 2006.10.17
申请号 US20040482740 申请日期 2004.01.05
申请人 TOHO ENGINEERING KABUSHIKI KAISHA 发明人 SUZUKI TATSUTOSHI
分类号 B24B1/00;B24B37/00;B24B37/04;B24B37/20;B24B37/24;B24B37/26;B24D3/28;B24D11/00;H01L21/302;H01L21/304;H01L21/461 主分类号 B24B1/00
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