发明名称 Method of manufacturing transistor having germanium implant region on the sidewalls of the polysilicon gate electrode
摘要 The present invention provides a transistor 100 having a germanium implant region 170 located therein, a method of manufacture therefor, and an integrated circuit including the aforementioned transistor. The transistor 100 , in one embodiment, includes a polysilicon gate electrode 140 located over a semiconductor substrate 110 , wherein a sidewall of the polysilicon gate electrode 140 has a germanium implanted region 170 located therein. The transistor 100 further includes source/drain regions 160 located within the semiconductor substrate 110 proximate the polysilicon gate electrode 140.
申请公布号 US7118979(B2) 申请公布日期 2006.10.10
申请号 US20030701818 申请日期 2003.11.05
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 LIU KAIPING;WU ZHIQIANG;MANSOORZ MAJID MOVAHED
分类号 H01L21/336;H01L21/265;H01L21/28;H01L21/8238;H01L29/49;H01L29/78 主分类号 H01L21/336
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