发明名称 |
Method of manufacturing transistor having germanium implant region on the sidewalls of the polysilicon gate electrode |
摘要 |
The present invention provides a transistor 100 having a germanium implant region 170 located therein, a method of manufacture therefor, and an integrated circuit including the aforementioned transistor. The transistor 100 , in one embodiment, includes a polysilicon gate electrode 140 located over a semiconductor substrate 110 , wherein a sidewall of the polysilicon gate electrode 140 has a germanium implanted region 170 located therein. The transistor 100 further includes source/drain regions 160 located within the semiconductor substrate 110 proximate the polysilicon gate electrode 140.
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申请公布号 |
US7118979(B2) |
申请公布日期 |
2006.10.10 |
申请号 |
US20030701818 |
申请日期 |
2003.11.05 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
LIU KAIPING;WU ZHIQIANG;MANSOORZ MAJID MOVAHED |
分类号 |
H01L21/336;H01L21/265;H01L21/28;H01L21/8238;H01L29/49;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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