发明名称 Phase contrast microscope for short wavelength radiation and imaging method
摘要 A phase contrast x-ray microscope has a phase plate that is placed in proximity of and attached rigidly to the objective to form a composite optic. This enables easier initial and long-term maintenance of alignment of the microscope. In one example, they are fabricated on the same high-transmissive substrate. The use of this composite optic allows for lithographic-based alignment that will not change over the lifetime of the instrument. Also, in one configuration, the phase plate is located between the test object and the objective.
申请公布号 US7119953(B2) 申请公布日期 2006.10.10
申请号 US20020331108 申请日期 2002.12.27
申请人 XRADIA, INC. 发明人 YUN WENBING;WANG YUXIN
分类号 G21K1/06;G21K7/00 主分类号 G21K1/06
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