发明名称 RFID application test systems and methods
摘要 Systems and methods are disclosed herein to provide location determination for the application of radio frequency identification (RFID) devices (e.g., performance evaluation of one or more RFID devices for various locations on an object to be associated with an RFID device). For example, in accordance with an embodiment of the present invention, an RFID test device includes a housing, an RFID device coupled to the housing, and a near field coupler contained at least partially within the housing and configured to communicate in a near field region with the RFID device.
申请公布号 US2006202705(A1) 申请公布日期 2006.09.14
申请号 US20060370459 申请日期 2006.03.08
申请人 FORSTER IAN J 发明人 FORSTER IAN J.
分类号 G01R31/302;G01R31/26;G06F11/00;G08B13/14 主分类号 G01R31/302
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