发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR USING MULTICHARGED ION |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor using multicharged ion which can obtain an extremely quick etching rate by utilizing a multiple valued ion beam for exposure in an exposure irradiation process in a lithography process which manufactures the semiconductor. SOLUTION: The method of manufacturing the semiconductor utilizes the multiple valued ion beam in the lithography process in the semiconductor manufacturing process. In the exposure irradiation process in the lithography process, the multiple valued ion beam is irradiated to a test piece for forming the semiconductor. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2006245052(A) |
申请公布日期 |
2006.09.14 |
申请号 |
JP20050054751 |
申请日期 |
2005.02.28 |
申请人 |
KOCHI UNIV OF TECHNOLOGY;TOKYO UNIV OF SCIENCE;TOYAMA UNIV |
发明人 |
MOMOTA SATAO;NOJIRI YOICHI;MIYAMOTO IWAO;TANIGUCHI ATSUSHI;MORITA NOBORU;KAWASEKI NORITAKA |
分类号 |
H01L21/306 |
主分类号 |
H01L21/306 |
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