TEST DEVICE, TEST METHOD, ELECTRONIC DEVICE MANUFACTURING METHOD, TEST SIMULATOR, AND TEST SIMULATION METHOD

摘要

It is possible to accurately evaluate the performance of an electronic device by testing correlation between timings at which a plurality of output signals outputted from the electronic device change. A test device tests the electronic device by applying a test signal to the electronic device and comparing output signals to respective expected values. The test device includes: reference timing detection means for detecting that an output signal has changed; setting means for setting in advance, a minimum time between the moment when one output signal has changed and the moment when another output signal has changed; acquisition means for acquiring the value of the another output signal at the timing when the minimum time has elapsed after the output signal changed; and distinguishing means for distinguishing the electronic device as a defective device if the value of the another output signal acquired does not coincide with the value which the another output signal should take after the minimum time elapsed.