发明名称 MEMORY APPARATUS, ITS PERFORMANCE, AND MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a memory apparatus comprising external magnetic field generating means, its performance, and manufacturing method. SOLUTION: The invention comprises magnetic memory means comprising an MTJ cell 42, a transistor, and a bit line 44, and magnetic field generating means which is provided on the exterior of the magnetic memory means and which is for generating a global magnetic field in parallel with a bit line toward the magnetic memory means. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006245585(A) 申请公布日期 2006.09.14
申请号 JP20060055420 申请日期 2006.03.01
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 KIM TAE-WAN;HWANG IN-JUN;JEONG WON-CHEOL
分类号 H01L27/105;H01L21/8246;H01L43/08 主分类号 H01L27/105
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