发明名称 SINGLE CRYSTAL SILICON THIN-FILM TRANSISTOR
摘要 PROBLEM TO BE SOLVED: To provide a silicon thin-film transistor wherein the degree of the movement of a carrier of a channel region becomes the maximum, and which is formed on a substrate made of arbitrary substances containing soda glass. SOLUTION: The single-crystal silicon thin-film transistor has a single crystal in which the direction pf the crystallization of a silicon thin-film formed on the substrate on which an amorphous silicon thin-film can be deposited is parallel with the surface of the substrate. In the single-crystal silicon thin film in the single-crystal silicon thin-film transistor of, a neutral Ne beam is radiated at low energy capable of controlling a crystal direction to the substrate on which an amorphous silicon thin film is deposited which is perpendicular to the substrate respectively at an angle of nearly 54.7°from both directions, without causing sputtering to the amorphous silicone thin film, and it is heated in the irradiation region of the neutral Ne beam at a high temperature lower than the fusion temperature of the substrate. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006245326(A) 申请公布日期 2006.09.14
申请号 JP20050059419 申请日期 2005.03.03
申请人 ASK KK 发明人 ASAKAWA TOSHIBUMI
分类号 H01L21/20;H01L21/263;H01L21/336;H01L29/786 主分类号 H01L21/20
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