发明名称 METHOD OF CLEANING SUBSTRATE-PROCESSING DEVICE AND SUBSTRATE-PROCESSING DEVICE
摘要 In a cleaning step of a substrate- processing device, vacuum drawing is made for the space between an inner chamber and an outer chamber that receives the inner chamber. Temperature of the inner chamber is set higher than the temperature of the inner chamber during substrate processing and set lower than the temperature of a substrate support member. After that, a cleaning gas containing hexafluoroacetylaceton (Hhfac) is supplied in the inner chamber, and substances to be cleaned off adhering inside the inner chamber are removed.
申请公布号 KR20060097138(A) 申请公布日期 2006.09.13
申请号 KR20067017124 申请日期 2006.08.25
申请人 TOKYO ELECTRON LIMITED 发明人 SHINRIKI HIROSHI;DOBASHI KAZUYA;SUZUKI MIKIO;MAGARA TAKASHI
分类号 H01L21/304;C23C16/44;H01L21/205 主分类号 H01L21/304
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