发明名称 |
Method and apparatus for measuring a concentration of a component in a subject |
摘要 |
A method of measuring a concentration of a component in a subject includes setting an intensity relationship equation between a positive-order beam and a negative-order beam with respect to a reference matter at a particular wavelength, applying a light having a first wavelength band absorbed by the component and detecting an intensity of a positive-order beam output from the subject and an intensity of a negative-order beam output from the reference matter, the positive-order beam and the negative-order beam having a second wavelength band, calculating an intensity of a positive-order beam input to the subject by applying the intensity of the negative-order beam output from the reference matter to the intensity relationship equation, and calculating absorbance using the intensity of the positive-order beam output from the subject and the intensity of the positive-order beam input to the subject and measuring a concentration of the component using the absorbance.
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申请公布号 |
US7107087(B2) |
申请公布日期 |
2006.09.12 |
申请号 |
US20040801612 |
申请日期 |
2004.03.17 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HWANG IN-DUK;YOON GIL-WON;HAN SANG-JOON;JEON KYE-JIN |
分类号 |
A61B5/00;G01N21/27;G01J3/12;G01J3/42;G01N21/31;G01N21/35;G01N21/62 |
主分类号 |
A61B5/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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