发明名称 PHOTOELECTRON MULTIPLICATION SYSTEM AND MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a photoelectron multiplication system that is so structured as to be able to measure even an extremely weak optical signal with a structurally simple means; and to provide a microscope having the system. SOLUTION: This photoelectron multiplication system including a detection tube, and an acceleration voltage supply unit for supplying an acceleration voltage necessary for operating the detection tube is characterized by arranging the detection tube 1 and the acceleration voltage supply unit 2 on the sides different from each other of a thermal separation element 3. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006237003(A) 申请公布日期 2006.09.07
申请号 JP20060045428 申请日期 2006.02.22
申请人 LEICA MICROSYSTEMS CMS GMBH 发明人 SEIFERT ROLAND;SCHNEIDER JUERGEN
分类号 H01J43/30;G02B21/00 主分类号 H01J43/30
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