发明名称 |
PHOTOELECTRON MULTIPLICATION SYSTEM AND MICROSCOPE |
摘要 |
PROBLEM TO BE SOLVED: To provide a photoelectron multiplication system that is so structured as to be able to measure even an extremely weak optical signal with a structurally simple means; and to provide a microscope having the system. SOLUTION: This photoelectron multiplication system including a detection tube, and an acceleration voltage supply unit for supplying an acceleration voltage necessary for operating the detection tube is characterized by arranging the detection tube 1 and the acceleration voltage supply unit 2 on the sides different from each other of a thermal separation element 3. COPYRIGHT: (C)2006,JPO&NCIPI
|
申请公布号 |
JP2006237003(A) |
申请公布日期 |
2006.09.07 |
申请号 |
JP20060045428 |
申请日期 |
2006.02.22 |
申请人 |
LEICA MICROSYSTEMS CMS GMBH |
发明人 |
SEIFERT ROLAND;SCHNEIDER JUERGEN |
分类号 |
H01J43/30;G02B21/00 |
主分类号 |
H01J43/30 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|