发明名称 LITHOGRAPHIC SYSTEMS AND METHODS WITH EXTENDED DEPTH OF FOCUS
摘要 Apparatus for increasing the depth of focus in a lithographic system, comprising: optics for imaging a reticle or photomask onto a lithographic recording medium having a threshold of exposure; a pupil plane function that alters the aerial image of the lithographic imaging system such that part of the aerial image is above a recording threshold of the lithographic recording medium over the extended depth of focus, the pupil plane function altering a system response function and the aerial image by affecting phase of a wavefront imaged by the optics.
申请公布号 EP1687829(A1) 申请公布日期 2006.08.09
申请号 EP20040754175 申请日期 2004.06.01
申请人 CDM OPTICS, INC. 发明人 DOWSKI, EDWARD, RAYMOND, JR.;JOHNSON, GREGORY, E.;KUBALA, KENNETH, SCOTT;WADE, THOMAS, CATHEY, JR.
分类号 G03F7/20;G02B27/00;G03B27/00 主分类号 G03F7/20
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