发明名称 Direct collection transmission electron microscopy
摘要 A preferred method for transmission electron microscopy includes a step of generating a microscopy signal. The microscopy signal is then detected with an active pixel detector that includes a plurality of pixels. Each of the pixels includes at least one photodiode. Each pixel integrates an incident signal over a collection time period. Using a massibel parallel on chip analog to digital conversion, very fast read out times can be achieved, e.g., many frames per second. In a preferred embodiment, the read out time permits there to be a single electron event recorded per pixel, indicating either a single electron or the lack thereof. This permits simple accumulation of the pixel counts for each pixel in read-out and storage electronics.
申请公布号 US2006169901(A1) 申请公布日期 2006.08.03
申请号 US20050295148 申请日期 2005.12.06
申请人 THE REGENTS OF THE UNIVERSITY OF CALIFORNIA 发明人 NGUYEN-HUU XUONG;ELLISMAN MARK H.;KLEINFELDER STUART;DENES PETER
分类号 G21K7/00 主分类号 G21K7/00
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