发明名称 Method of manufacturing a MOS field effect transistor with a recombination zone
摘要 Production of a MOSFET comprises structuring a starting material (3) with a trench oxide layer (1) and a thin active silicon layer (2); epitaxially depositing silicon (5) onto the structured starting material; counter doping a channel region; exposing partial regions (8) of the oxide layer; etching to remove silicon oxide; forming a gate oxide and a polysilicon gate (13); structuring the polysilicon; forming a source doping; forming a dielectric; structuring a metal; and forming gate and source contacts. Preferred Features: The starting material is wafer-bonded SOI material. The trench oxide layer is produced by implanting oxygen.
申请公布号 EP1205969(A3) 申请公布日期 2006.08.02
申请号 EP20010125066 申请日期 2001.10.22
申请人 INFINEON TECHNOLOGIES AG 发明人 KROENER, FRIEDRICH
分类号 H01L21/336;H01L29/06;H01L29/167;H01L29/41;H01L29/423;H01L29/78 主分类号 H01L21/336
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