发明名称 A METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
摘要 <p>A mask including a material, which has heat resistance and light absorptivity, is selectively formed on a crystalline silicon film containing a catalytic element. Next, by using the mask, phosphorus is implanted into the silicon film and an implanted portion of the silicon film is transformed into amorphous. Then the silicon film is heated by a rapid thermal annealing (RTA) method, so that the temperature of the portion covered with the mask becomes higher than other portions. As a result, the catalytic element moves from the high temperature portion covered with the mask to the lower temperature amorphous portion in which phosphorus has been implanted and which has a large gettering capacity. Thus, the concentration of the catalytic element in the portion covered with the mask is lowered, and a semiconductor device is manufactured by using the film.</p>
申请公布号 KR20060086807(A) 申请公布日期 2006.08.01
申请号 KR20050075619 申请日期 2005.08.18
申请人 SEMICONDUCTOR ENERGY LABORATORY K.K. 发明人 YAMAZAKI SHUNPEI;OHTANI HISASHI
分类号 H01L29/786;H01L21/20;H01L21/322;H01L21/336 主分类号 H01L29/786
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