发明名称 |
Method and system of modifying data in functional latches of a logic unit during scan chain testing thereof |
摘要 |
A method of modifying data of functional latches of a logic unit during scan chain testing thereof to verify a test case failure of a suspected cell comprises: (a) determining a test case failure in the logic unit through scan chain testing thereof; (b) suspending clocked operations of the logic unit; (c) during suspended clocked operations of the logic unit, performing the following steps: (i) reading logic states of the functional latches; and (ii) modifying the logic state of at least one of the functional latches based on the determined test case failure; (d) restarting clocked operations of the logic unit; and (e) reading logic states of the functional latches resulting from the modification to verify the test case failure of a suspected cell.
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申请公布号 |
US2006161826(A1) |
申请公布日期 |
2006.07.20 |
申请号 |
US20050038733 |
申请日期 |
2005.01.20 |
申请人 |
GHISIAWAN NAVIN A;LAAKE KEVIN M;HOWLETT JOHN R |
发明人 |
GHISIAWAN NAVIN A.;LAAKE KEVIN M.;HOWLETT JOHN R. |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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