发明名称 Testing system, a computer implemented testing method and a method for manufacturing electronic devices
摘要 A testing system includes a testing device configured to test product characteristics of a first sample by sampling the first sample from a population; a main storage device configured to store analysis information and testing information, the testing information includes a confidence interval tolerance of the first sample; an analysis module configured to analyze at least one of statistical data and a confidence interval of a mean value of the population, based on the analysis information; and a calculation module configured to calculate a first sampling number of the first sample, based on results of the analysis module.
申请公布号 US2006161385(A1) 申请公布日期 2006.07.20
申请号 US20060377250 申请日期 2006.03.17
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 ASANO MASAFUMI
分类号 G06F17/18;H01L21/66;H01L21/02 主分类号 G06F17/18
代理机构 代理人
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