发明名称 Semiconductor input protection circuit
摘要 A lateral PNP transistor PB and a lateral NPN transistor NB are serially connected between an input terminal and a reference potential (ground potential). In the transistor PB, a diode D<SUB>1 </SUB>is formed. In the transistor NB, a diode D<SUB>3 </SUB>is formed. When an ESD of +2000 V is input, the transistor NB turns on, whereas when an ESD of -2000 V is input, the transistor PB turns on. The level of a positive signal capable of being input is limited by the inverse breakdown voltage (e.g., 18 to 50 V) of the diode D<SUB>3</SUB>, whereas the level of a negative signal capable of being input is limited by the inverse breakdown voltage (e.g., 13 to 15 V) of the diode D<SUB>1</SUB>.
申请公布号 US7075123(B2) 申请公布日期 2006.07.11
申请号 US20040968685 申请日期 2004.10.19
申请人 YAMAHA CORPORATION 发明人 TSUJI NOBUAKI;NORO MASAO;MAENO TERUMITSU;HIRADE SEIJI
分类号 H01L27/04;H01L29/74;H01L21/822;H01L21/8238;H01L23/62;H01L27/02;H01L27/06;H01L27/092 主分类号 H01L27/04
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