发明名称 SURGE PROTECTING SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a surge protecting semiconductor device which has a low capacitance and a high surge resistance. SOLUTION: In the surge protecting semiconductor device, a side surface and bottom surface of a p-type epitaxial layer 3 of a low concentration are closed with an n-type semiconductor layer 4 and n-type semiconductor substrate 1, and a p-type semiconductor layer 2 is included which extends from the surface of the p-type semiconductor device into its layer. When applying a reverse bias between the p-type semiconductor layer 2 and the n-type semiconductor substrate 1, a depletion layer produced in the p-type epitaxial layer 3 of a low concentration becomes like a continuous bowl along the side surface to bottom surface of the epitaxial layer 3, and since the p-type epitaxial layer 3 is of a low concentration, the depletion layer can occupy a large area and then becomes a low capacitance. Further, increasing a reverse bias allows the depletion layer to reach the bottom surface of the p-type semiconductor layer 2 to be a punch-through, and a non-concentrative, a loose distribution of a current can be obtained just below the p-type semiconductor layer 2, thereby forming the surge protecting semiconductor device having a high surge resistance. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006179823(A) 申请公布日期 2006.07.06
申请号 JP20040373966 申请日期 2004.12.24
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 ONISHI KAZUHIRO
分类号 H01L29/861;H01L21/329 主分类号 H01L29/861
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