发明名称 X-RAYS FOREIGN MATTER DETECTING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an X-ray foreign matter detecting apparatus capable of heightening a processing capacity, while maintaining foreign matter detection accuracy by the X-ray at a required level. SOLUTION: This X-ray foreign matter detecting apparatus is equipped with a conveyance means 10 for conveying an object under inspection, and a foreign matter detection means 20 for detecting a foreign matter included in the object under inspection by irradiating the object under inspection conveyed by the conveyance means 10 with the X-ray in a prescribed inspection domain. The conveyance means 10 has a plurality of tubular conveyance routes p1, p2 in parallel in the inspection domain, and the foreign matter detection means 20 is constituted by including an X-ray generation part 21 for irradiating the X-ray toward the object under inspection in the plurality of conveyance routes p1, p2, and an X-ray detection part 22 for detecting the X-ray transmitted through the object under inspection in the plurality of conveyance routes. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006170713(A) 申请公布日期 2006.06.29
申请号 JP20040361587 申请日期 2004.12.14
申请人 ANRITSU SANKI SYSTEM CO LTD 发明人 KOBAYASHI HIROAKI
分类号 G01N23/04;B07C5/38;G01N23/12;G01V5/00 主分类号 G01N23/04
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