发明名称 Device manufacturing method, top coat material and substrate
摘要 In immersion lithography, to avoid internal reflections in the final element of the projection system, immersion fluid and topcoat, the thicknesses, d<SUB>l</SUB>, d<SUB>tc </SUB>and d<SUB>r</SUB>, and refractive indices, n<SUB>l</SUB>, n<SUB>tc </SUB>and n<SUB>r</SUB>, of the immersion fluid, topcoat and resist may meet the following criteria: <?in-line-formulae description="In-line Formulae" end="lead"?>n<SUB>l</SUB><=N<SUB>tc</SUB><=N<SUB>r </SUB><?in-line-formulae description="In-line Formulae" end="tail"?> <?in-line-formulae description="In-line Formulae" end="lead"?>d<SUB>l</SUB>>~5.lambda<?in-line-formulae description="In-line Formulae" end="tail"?> <?in-line-formulae description="In-line Formulae" end="lead"?>d<SUB>tc</SUB><=~5lambda<?in-line-formulae description="In-line Formulae" end="tail"?>
申请公布号 US2006138602(A1) 申请公布日期 2006.06.29
申请号 US20040022935 申请日期 2004.12.28
申请人 ASML NETHERLANDS B.V. 发明人 MULKENS JOHANNES C.H.;MARIE DIERICHS MARCEL M.T.
分类号 H01L21/42 主分类号 H01L21/42
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