发明名称 METHOD OF FORMING CONTACT HOLE AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE
摘要 A method of forming contact holes is provided. A substrate having a plurality of device structures is provided. A first dielectric layer and a conductive layer sequentially cover the device structures and the surface of the substrate. A recess is formed in the conductive layer between every two neighboring device structures. A pair of composite spacers is formed in the recess. By using the composite spacers as a mask, a portion of the exposed conductive layer is removed to form a plurality of openings between every two neighboring device structures. A second dielectric layer is then formed on the sidewalls of the openings. A third dielectric layer is formed over the substrate. Portions of the third dielectric layer and the first dielectric layer above the openings are removed to form a plurality of self-aligned contact holes.
申请公布号 US2006134910(A1) 申请公布日期 2006.06.22
申请号 US20050908871 申请日期 2005.05.31
申请人 HUANG MIN-SAN;LAI LEON;WANG PIN-YAO 发明人 HUANG MIN-SAN;LAI LEON;WANG PIN-YAO
分类号 H01L21/4763 主分类号 H01L21/4763
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