Mass Measuring System Using Inertia Force and Standard Masses in the Micro-Gravity Environment and Method thereof,申请号KR20040055190-传众专利搜索

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发明名称	Mass Measuring System Using Inertia Force and Standard Masses in the Micro-Gravity Environment and Method thereof
摘要
申请公布号	KR100587822(B1)	申请公布日期	2006.06.12
申请号	KR20040055190	申请日期	2004.07.15
申请人		发明人
分类号	G01L1/22;G01G11/14	主分类号	G01L1/22
代理机构		代理人
主权项
地址

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