发明名称 TANGIBLE COMPONENT ANALYZER AND TANGIBLE COMPONENT ANALYSIS METHOD
摘要 PROBLEM TO BE SOLVED: To acquire clear static picture image by rapidly and accurately focusing on a tangible component at an imaging position to perform efficient analysis processing. SOLUTION: This tangible component analyzer is equipped with: a unified plate 122 comprising an imaging base surface for thereon spreading a supplied test liquid in order to image the test liquid; an imaging stage 121 for thereon holding the unified plate 122; an imaging part 131 for imaging the tangible component of the test liquid spread in a static state on the base surface of the unified plate 122; a control part 171 for previously detecting a height correction value for focusing the imaging part 131 on the tangible component of the test liquid to relatively move/control the imaging part 131 or imaging stage 121 in the height direction by using the correction value when imaging the test liquid by the imaging part 131; an XY stage 142; and a Z stage 143. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006138654(A) 申请公布日期 2006.06.01
申请号 JP20040326289 申请日期 2004.11.10
申请人 A & T CORP 发明人 FUJISE HIDEKAZU;MORI KIYOO
分类号 G01N15/14;G01N33/493 主分类号 G01N15/14
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