发明名称 SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, SEMICONDUCTOR DEVICE MANUFACTURING APPARATUS, AND COMPUTER RECORDING MEDIUM
摘要 The capacitance of a capacitor is prevented from decreasing without increasing the thickness. A capacitor of a semiconductor device comprises lower and upper electrodes and an insulating film interposed between the lower and upper electrodes. The surface, on the insulating layer side, of the lower electrode is nitrided. When the lower electrode is made of polysilicon, the oxidation resistance at heat treatment in the after-process is improved because the surface is nitrided. Particularly in the case of a DRAM, at the effect is strong since the capacitance of the capacitor is large. Further the leak current in the capacitor is reduced.
申请公布号 KR20060058723(A) 申请公布日期 2006.05.30
申请号 KR20067005870 申请日期 2006.03.24
申请人 TOKYO ELECTRON LIMITED 发明人 SASAKI MASARU
分类号 H01L27/108;H01L21/02;H01L21/316;H01L21/8242 主分类号 H01L27/108
代理机构 代理人
主权项
地址