发明名称 Method of chemical mechanical polishing
摘要 A method of chemical mechanical polishing that polishes a substrate by abrading a target material formed on the substrate with a polishing pad containing a slurry includes setting a polishing end time, at which time a predetermined thickness of the target material will have been removed from the substrate by polishing, polishing the substrate to remove the predetermined thickness of the target material, and increasing a level of byproduct contamination in the polishing pad to decrease a polishing rate, while polishing the substrate, so that the polishing rate decreases to approximately zero at the polishing end time.
申请公布号 US7048612(B2) 申请公布日期 2006.05.23
申请号 US20040920323 申请日期 2004.08.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE SUNG-BAE;HA SANG-ROK;LEE HYO-JONG
分类号 B24B1/00;B24B37/04;H01L21/3105;H01L21/321 主分类号 B24B1/00
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