发明名称 Damascene structure at semiconductor substrate level
摘要 A damascene structure and process at semiconductor substrate level. A pre-metal dielectric layer is provided on a semiconductor substrate with an opening exposing a contact region on the substrate. A buffer metal layer is provided on the exposed contact region, and a barrier layer is provided on the interior of the opening. A conductor is provided on the buffer metal layer, substantially filling the opening to electrically connect to the contact region.
申请公布号 US7049702(B2) 申请公布日期 2006.05.23
申请号 US20030640757 申请日期 2003.08.14
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 TSENG HORNG-HUEI
分类号 H01L29/40;H01L21/768;H01L23/485 主分类号 H01L29/40
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