| 摘要 |
This invention aims to provide an IC tester which can achieve a reduction in testing time and the invention provides improvements to an IC tester which tests a device under test and which outputs an multistage pressure. The apparatus of the present invention is characterized by including A/D converter which inputs output from the device under test, a memory which stores output from the A/D converter, and a digital comparator which compares output from the A/D converter and pressure data for comparison. |
