发明名称 Method and apparatus of fault diagnosis for integrated logic circuits
摘要 In a method for diagnosing faults in an integrated logic circuit including a plurality of input signal lines, a plurality of output signal lines and a plurality of gates connected between the input signal lines and the output signal lines, different symbols are injected into fanout branches of one faulty candidate of the gates.
申请公布号 US2006107157(A1) 申请公布日期 2006.05.18
申请号 US20050184830 申请日期 2005.07.20
申请人 KYUSHU INSTITUTE OF TECHNOLOGY 发明人 WEN XIAOQUING;KAJIHARA SEIJI
分类号 G01R31/28;G06F11/00 主分类号 G01R31/28
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