发明名称 POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMATION METHOD
摘要 A positive resist composition includes a resin component (A) whose alkaline solubility changes by an action of an acid, an acid generator component (B), and polypropylene glycol, wherein the component (A) includes a resin component (A1) including a constitutional unit (a1) represented by general formula (I), a constitutional unit (a2) represented by general formula (II), and a constitutional unit (a3) having an acid dissociable dissolution inhibiting group, wherein R represents a hydrogen atom or a methyl group, and m represents an integer of 1 to 3, wherein R represents a hydrogen atom or a methyl group, and R<SUP>1 </SUP>represents alkyl group having a carbon number of 1 to 5, and l represents an integer of 0 to 3.
申请公布号 KR20060046035(A) 申请公布日期 2006.05.17
申请号 KR20050039062 申请日期 2005.05.10
申请人 TOKYO OHKA KOGYO CO., LTD. 发明人 YONEMURA KOUJI;NAKAO TAKU
分类号 G03F7/027;G03F7/039;G03F7/004;G03F7/033;H01L21/027 主分类号 G03F7/027
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