发明名称 |
FORMING METHOD OF RESIST PATTERN, MANUFACTURING METHOD OF PATTERN SUBSTRATE, FORMING DEVICE OF RESIST PATTERN, MANUFACTURING METHOD OF DISPLAY DEVICE AND MANUFACTURING DEVICE OF DISPLAY DEVICE |
摘要 |
<p>A resist pattern formation apparatus includes a resist layer formation section of forming a resist layer on a substrate, an exposure section of applying light to the resist layer through a mask pattern, a development section of developing the resist layer, a defect inspection section of inspecting defect in a pattern of the resist layer, and a repair section of repairing a defect part of the pattern of the resist layer if needed according to an inspection result.</p> |
申请公布号 |
KR20060045508(A) |
申请公布日期 |
2006.05.17 |
申请号 |
KR20050028356 |
申请日期 |
2005.04.06 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
MURAKAMI KATSUAKI |
分类号 |
G02F1/13;H01L21/027;G02F1/136;G03B27/00;G03C5/00;G03F7/00;G03F7/16;G03F7/20;G03F7/26;G03F7/40;G06K9/00;G09F9/00 |
主分类号 |
G02F1/13 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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