发明名称 FORMING METHOD OF RESIST PATTERN, MANUFACTURING METHOD OF PATTERN SUBSTRATE, FORMING DEVICE OF RESIST PATTERN, MANUFACTURING METHOD OF DISPLAY DEVICE AND MANUFACTURING DEVICE OF DISPLAY DEVICE
摘要 <p>A resist pattern formation apparatus includes a resist layer formation section of forming a resist layer on a substrate, an exposure section of applying light to the resist layer through a mask pattern, a development section of developing the resist layer, a defect inspection section of inspecting defect in a pattern of the resist layer, and a repair section of repairing a defect part of the pattern of the resist layer if needed according to an inspection result.</p>
申请公布号 KR20060045508(A) 申请公布日期 2006.05.17
申请号 KR20050028356 申请日期 2005.04.06
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 MURAKAMI KATSUAKI
分类号 G02F1/13;H01L21/027;G02F1/136;G03B27/00;G03C5/00;G03F7/00;G03F7/16;G03F7/20;G03F7/26;G03F7/40;G06K9/00;G09F9/00 主分类号 G02F1/13
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