| 摘要 |
Example embodiments of the present invention disclose a verifying circuit and a method of repairing a semiconductor device. The verifying circuit may include a first fuse circuit configured to determine whether a first fuse has been programmed, a test signal generating circuit configured to generate a test signal based on a control signal and an output signal from the first fuse circuit, and a second fuse circuit configured to test whether a plurality of second fuses are programmed based on the test signal. The method of repairing a defective memory cell may include programming a first fuse, testing whether the first fuse has been successfully programmed, and programming a second fuse based on a test result of the first fuse.
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