| 摘要 |
The invention provides a test apparatus for testing circuit units ( 101 a -101 k) to be tested by means of a test system ( 100 ), having a connection device ( 102 ), tester channels ( 103 a -103 m) for connecting the test system ( 100 ) to the connection device ( 102 ) and receptacle units ( 104 a -104 k), having a number (n<SUB>1</SUB>, n<SUB>2</SUB>, . . . , n<SUB>k</SUB>) of circuit unit data channels dependent on the circuit units ( 101-101 k) to be tested, provision being made of a changeover device ( 200 ) for changing over the tester channels ( 103 a -103 m) to the receptacle units ( 104 a -104 k), and it being possible to divide a number (m) of tester channels ( 103 a -103 m) between the number (n<SUB>1</SUB>, n<SUB>2</SUB>, . . . , n<SUB>k</SUB>) of circuit unit data channels in a predeterminable manner.
|
