| 摘要 |
The invention relates to an electrical test device having isolation slot. The electrical test device comprises a substrate and a plurality of test pads. The test pads are disposed on a second surface of the substrate. Each test pads has a test hole, a first isolation slot and a second isolation slot. The first isolation slot is disposed on the periphery of the test hole, and defines a signal region for connecting a signal terminal of a test probe. The second isolation slot is disposed on the periphery of the first isolation slot, and a ground region is defined between the first isolation slot and the second isolation slot. The ground region is used for connecting a ground terminal of the test probe. The test pad of the invention can match with the test probe so that the test probe can connect to the test pad for providing signal to the test probe. Therefore, the electrical test device can be utilized to easily measure the real electrical characteristic of the signal from the substrate.
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