发明名称 FILM DEPOSITION MATERIAL, FILM DEPOSITION METHOD AND ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide a technology for easily depositing a tungsten film (a tungsten silicide film or a tungsten nitride film) having high purity at a low temperature by using a raw material containing halogen which might cause adverse effect on a semi-conductor element. SOLUTION: A film deposition material is used for depositing a tungsten film, a tungsten silicide film or a tungsten nitride film. The W source of the film is one or two or more of compounds to be selected from a group of hexa-dimethyl-amino-di-tungsten, hexa-ethyl-methyl-amino tungsten, and hexa-diethyl-amino-di-tungsten. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006097099(A) 申请公布日期 2006.04.13
申请号 JP20040285719 申请日期 2004.09.30
申请人 TRI CHEMICAL LABORATORY INC 发明人 MACHIDA HIDEAKI;OSHITA YOSHIO;OGURA ATSUSHI;ISHIKAWA MASATO
分类号 C23C16/18;C23C16/34;C23C16/42;H01L21/28;H01L21/285 主分类号 C23C16/18
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