发明名称 |
FILM DEPOSITION MATERIAL, FILM DEPOSITION METHOD AND ELEMENT |
摘要 |
PROBLEM TO BE SOLVED: To provide a technology for easily depositing a tungsten film (a tungsten silicide film or a tungsten nitride film) having high purity at a low temperature by using a raw material containing halogen which might cause adverse effect on a semi-conductor element. SOLUTION: A film deposition material is used for depositing a tungsten film, a tungsten silicide film or a tungsten nitride film. The W source of the film is one or two or more of compounds to be selected from a group of hexa-dimethyl-amino-di-tungsten, hexa-ethyl-methyl-amino tungsten, and hexa-diethyl-amino-di-tungsten. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2006097099(A) |
申请公布日期 |
2006.04.13 |
申请号 |
JP20040285719 |
申请日期 |
2004.09.30 |
申请人 |
TRI CHEMICAL LABORATORY INC |
发明人 |
MACHIDA HIDEAKI;OSHITA YOSHIO;OGURA ATSUSHI;ISHIKAWA MASATO |
分类号 |
C23C16/18;C23C16/34;C23C16/42;H01L21/28;H01L21/285 |
主分类号 |
C23C16/18 |
代理机构 |
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地址 |
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