OPERATION ANALYZING METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, ANALYZING APPARATUS USED THEREFOR, AND OPTIMIZATION DESIGNING METHOD USING THE APPARATUS

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit wherein its voltage variation is so considered more accurately than conventional ones even when it is fined as to make it highly accurate and make its operational characteristic good. SOLUTION: An operation analyzing method for semiconductor integrated circuit devices is a power-supply-noise analyzing method based on the circuit information of a semiconductor integrated circuit device. Its analyzing accuracy is improved more highly than conventional ones, since it takes into account the impedance caused by a substrate which is not considered in conventional ones by so analyzing the power-supply noise as to consider the effect of the impedance caused by the substrate. COPYRIGHT: (C)2006,JPO&NCIPI