TEST FIXTURE FOR APPLICATION TEST AND SEMICONDUCTOR DEVICE APPLICATION TESTER HAVING THEREOF,申请号KR20040078153-传众专利搜索

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发明名称	TEST FIXTURE FOR APPLICATION TEST AND SEMICONDUCTOR DEVICE APPLICATION TESTER HAVING THEREOF
摘要
申请公布号	KR20060029725(A)	申请公布日期	2006.04.07
申请号	KR20040078153	申请日期	2004.10.01
申请人	UNITEST INC.	发明人	HUH, JAE SUK
分类号	G01R31/319;G01R31/26	主分类号	G01R31/319
代理机构		代理人
主权项
地址

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