发明名称 INSTRUMENT ZUR MESSUNG EINES SPEKTRUMS
摘要 In a spectrum measuring instrument of the present invention, a detecting surface of a detector is a two-dimensional detecting surface and spectrum light coming out from a dispersing element and is irradiated to a region A on the detecting surface. Signal intensity at the regions on the detecting surface other than the region A where the spectrum light is irradiated, is subtracted from signal intensity on the region A. Consequently, it is possible to obtain an accurate spectrum intensity signal by processing a detection signal in such a manner that adverse effects of stray light generated inside the spectrum measuring instrument and unwanted light generated by reflection and diffraction occurring on the surface of a detecting element are removed.
申请公布号 DE60109194(T2) 申请公布日期 2006.04.06
申请号 DE2001609194T 申请日期 2001.06.19
申请人 OTSUKA ELECTRONICS CO., LTD. 发明人 OKA, KOUICHI;OKAWAUCHI, MAKOTO
分类号 G01J3/28;G01J3/36;G01J3/18 主分类号 G01J3/28
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