发明名称 |
INSTRUMENT ZUR MESSUNG EINES SPEKTRUMS |
摘要 |
In a spectrum measuring instrument of the present invention, a detecting surface of a detector is a two-dimensional detecting surface and spectrum light coming out from a dispersing element and is irradiated to a region A on the detecting surface. Signal intensity at the regions on the detecting surface other than the region A where the spectrum light is irradiated, is subtracted from signal intensity on the region A. Consequently, it is possible to obtain an accurate spectrum intensity signal by processing a detection signal in such a manner that adverse effects of stray light generated inside the spectrum measuring instrument and unwanted light generated by reflection and diffraction occurring on the surface of a detecting element are removed. |
申请公布号 |
DE60109194(T2) |
申请公布日期 |
2006.04.06 |
申请号 |
DE2001609194T |
申请日期 |
2001.06.19 |
申请人 |
OTSUKA ELECTRONICS CO., LTD. |
发明人 |
OKA, KOUICHI;OKAWAUCHI, MAKOTO |
分类号 |
G01J3/28;G01J3/36;G01J3/18 |
主分类号 |
G01J3/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|