发明名称 Method for producing chips from wafers of low thickness
摘要 A method for producing chips from a wafer of low thickness, in which the wafer has an active side on which integrated circuits are arranged in a grid with interspaces and a metallized backside facing away from the active side, the method preferably includes the steps of: coating the active side of the wafer with a protective coating; covering the active side with a mask having light-transmitting lines disposed along the interspaces between the integrated circuits, the mask being otherwise non-light transmitting, exposing the light-transmitting lines to light for producing exposed lines; etching away the exposed lines; producing trenches having depth from the exposed lines; removing the protective coating on the active side of the wafer, applying a carrier on the active side of the wafer; grinding the metallized backside of the wafer; removing the metallized backside by way of etching to a wafer thickness of about 20 microns greater than the depth of the trenches; removing the metallized backside to a base of the trenches; and, releasing the chips from the carrier.
申请公布号 US7022587(B2) 申请公布日期 2006.04.04
申请号 US20030359549 申请日期 2003.02.05
申请人 KOENNEMANN BEATRIZ 发明人 KOENNEMANN BEATRIZ
分类号 H01L21/301;H01L21/304;H01L21/78 主分类号 H01L21/301
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