发明名称 Lithographic Apparatus and Device Manufacturing Method
摘要 An optical element of a lithographic projection apparatus includes a Si/Mo multilayer structure, an outer capping layer and an interlayer positioned between the multilayer structure and the outer capping layer. The interlayer has a thickness of between 0.3 and 0.7 times the wavelength of the incident radiation. The interlayer may be C or Mo and has a thickness of between 6.0 and 9.0 nm. The interlayer may include an inner interlayer including Mo next to the multilayer structure and an outer interlayer including C next to the capping layer. The outer interlayer is at least 3.4 nm thick and the capping layer is Ru and at least 2.0 nm thick.
申请公布号 KR100566144(B1) 申请公布日期 2006.03.30
申请号 KR20030059215 申请日期 2003.08.26
申请人 发明人
分类号 G03F7/20;G21K1/06;G21K5/00;G21K5/02;H01L21/027 主分类号 G03F7/20
代理机构 代理人
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