| 摘要 |
A semiconductor tester for testing a semiconductor device by generating pulses of different repetition periods to a DUT having ports of different periods (frequencies) without using plural timing memories holding timing sets. The semiconductor tester required to generate a timing edge pulse of a period M different from a test period N of the semiconductor tester comprises period converting means capable of generating a timing edge pulse of the period M different from the period N of the test rate without using timing set that the semiconductor tester has.
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