发明名称 Integrated circuit memory device supporting an N bit prefetch scheme and a 2N burst length
摘要 The present invention provides a dual data rate (DDR) integrated circuit memory device that is configured to support an N to 2N prefetch-to-burst length mode of operation. The DDR integrated circuit memory device is further configured to support a sequential address increase scheme and an interleave address increase scheme.
申请公布号 US7017010(B2) 申请公布日期 2006.03.21
申请号 US20030338398 申请日期 2003.01.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LA ONE-GYUN
分类号 G06F12/00;G11C11/401;G11C7/10;G11C8/04;G11C8/12;G11C11/4063;G11C11/408;G11C11/409;G11C11/4096 主分类号 G06F12/00
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