发明名称 Method and system for fabricating free-standing nanostructures
摘要 Systems and methods include introducing a semiconductor wafer into a process chamber. An etching chemistry is injected into the process chamber to etch a patterned layer and to release free-standing nanostructures on the semiconductor wafer. The etching chemistry includes a supercritical or liquid carbon dioxide fluid and an etching solution. The semiconductor wafer is rinsed by flooding a supercritical or liquid carbon dioxide fluid into the process chamber. The semiconductor wafer is dried by venting out supercritical or liquid carbon dioxide fluid from the process chamber.
申请公布号 US7008853(B1) 申请公布日期 2006.03.07
申请号 US20050066320 申请日期 2005.02.25
申请人 INFINEON TECHNOLOGIES, AG 发明人 DUPONT AUDREY;HOYER RONALD
分类号 H01L21/20 主分类号 H01L21/20
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