发明名称 OPTICAL INTERFERENCE TOMOGRAPH
摘要 <p>An optical interference tomograph in which a thick (or thin) part of an examinee can be grasped intuitively when a "position-layer thickness" graph is displayed from two-dimensional or three-dimensional tomographic information on the examinee. In the optical interference tomograph, layer thickness at each position on a scanning line is calculated for at least one of layers constituting the examinee according to two-dimensional tomographic information on the examinee which is obtained, for example by scanning the surface thereof with irradiation light. Subsequently, an axial line indicating a position on the scanning line is displayed in a shape similar to that of the scanning line and the calculated layer thickness is plotted with a predetermined scale from the axial line in the direction normal to the axial line.</p>
申请公布号 WO2006022045(A1) 申请公布日期 2006.03.02
申请号 WO2005JP06789 申请日期 2005.04.06
申请人 NATIONAL UNIVERSITY CORPORATION NAGOYA UNIVERSITY;ITO, YASUKI 发明人 ITO, YASUKI
分类号 A61B3/10;A61B3/12;G01B11/06;G01N21/17;G01N21/35;G01N21/359;(IPC1-7):G01B11/06;A61B1/00 主分类号 A61B3/10
代理机构 代理人
主权项
地址