发明名称 Composition for removing a photoresist residue and polymer residue, and residue removal process using same
摘要 A composition for removing a photoresist residue and polymer residue to remove a photoresist residue and an ashing residue remaining after dry etching and after ashing of a semiconductor substrate having metal wiring formed from aluminum or an aluminum alloy is provided, the composition containing at least one type of fluorine compound (excluding hydrofluoric acid), at least one type of sulfonic acid, and water.
申请公布号 US2006046944(A1) 申请公布日期 2006.03.02
申请号 US20050210494 申请日期 2005.08.24
申请人 KANTO KAGAKU KABUSHIKI KAISHA 发明人 HATA KISATO;OOWADA TAKUO
分类号 C11D7/32 主分类号 C11D7/32
代理机构 代理人
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