| 摘要 |
PROBLEM TO BE SOLVED: To enhance the probability of detecting contamination of a conductive foreign matter contaminated in an electro-optic substance. SOLUTION: The present invention provides a method of inspecting an electro-optic device having a step for impressing an alternating current voltage to the electro-optic substance, and a step for reducing a cell gap between a picture element electrode and a counter electrode, in the electro-optic device having constitution sandwiched with the electro-optic substance between the picture element electrode and the counter electrode. COPYRIGHT: (C)2006,JPO&NCIPI
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