发明名称 Flash memory structure and fabrication method thereof
摘要 A flash memory structure comprises a semiconductor substrate, a source region, a drain region, a first insulating dielectric layer, a floating gate, a second insulating dielectric layer, and a control gate. The semiconductor substrate has a first top surface and a second top surface that is lower than the first top surface. The source region and the drain region are respectively in the second top surface and the first top surface of the semiconductor substrate, and the semiconductor substrate connecting the source region and the drain region is a vertical channel region. The whole channel region is covered by the first insulating dielectric layer, the floating gate, the second insulating dielectric layer, and the control gate in turn.
申请公布号 US2006033147(A1) 申请公布日期 2006.02.16
申请号 US20040981653 申请日期 2004.11.05
申请人 PROMOS TECHNOLOGIES INC. 发明人 TANG MING
分类号 H01L21/336;H01L21/28;H01L21/8247;H01L27/115;H01L29/76 主分类号 H01L21/336
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