发明名称 |
Integrated semiconductor structure for reliability tests of dielectrics |
摘要 |
A test structure for assessing the reliability of a dielectric of a circuit element in an integrated circuit includes a plurality of test circuit elements and a plurality of contact pads, wherein at least some of the test circuit elements share one or more of the contact pads. In this way, a failure event can be detected with a reduced number of contact pads, thereby significantly reducing the area of floor space occupied by the test structure.
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申请公布号 |
US6995027(B2) |
申请公布日期 |
2006.02.07 |
申请号 |
US20030649051 |
申请日期 |
2003.08.27 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
WIECZOREK KARSTEN;GEILENKEUSER ROLF;WEIDNER JOERG-OLIVER |
分类号 |
G01R31/26;H01L23/544 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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