发明名称 SIGNAL AMPLIFICATION METHOD, SIGNAL AMPLIFIER, AND FOREIGN MATERIAL INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To amplify a signal whose strength is greatly changed by one amplification means while keeping a response speed with respect to an input signal constant. SOLUTION: An amplifier 12 configures a feedback amplifier circuit with a resistor R1. A reference voltage generating circuit 14, a clamp circuit 15, an offset circuit 16, an inverted gain circuit 17, a field effect transistor (FET) 18, and a resistor R2 configure a gain control circuit for controlling the gain of the feedback amplifier circuit. The clamp circuit 15 clamps an input voltage to the signal amplifier 10 by using a reference voltage generated by the reference voltage generating circuit 14. The offset circuit 16 offsets an output voltage from the clamp circuit 15 toward a negative side. The inverted gain circuit 17 inverts the polarity of the output voltage of the offset circuit 16 to amplify the inverted output voltage. The field effect transistor 18 is activated by using the output voltage of the inverted gain circuit 17 for a control voltage and supplies a current to a feedback loop of the feedback amplifier circuit from a power supply V2 via the resistor R2. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006033003(A) 申请公布日期 2006.02.02
申请号 JP20040204131 申请日期 2004.07.12
申请人 HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO LTD 发明人 ISHII TAKASHI
分类号 H03G3/30;G01B11/30;H03G3/20 主分类号 H03G3/30
代理机构 代理人
主权项
地址